Broad-band High-Energy Resolution Hard X-ray Spectroscopy using Transition Edge Sensors at SPring-8

We have succeeded in operating a transition-edge sensor (TES) spectrometer and evaluating its performance at the SPring-8 synchrotron X-ray light source. The TES spectrometer consists of a 240 pixel National Institute of Standards and Technology (NIST) TES system, and 220 pixels are operated simultaneously with an energy resolution of $4$eV at 6keV at a rate of about 1~c/s/pixel. The tolerance for high count rates is evaluated in terms of energy resolution and live time fraction, leading to an empirical compromise of about 2 x 10^3 c/s/all pixels with an energy resolution of 5 eV at 6 keV. By utilizing the TES's wide-band spectroscopic capability, simultaneous multi-element analysis is demonstrated for a standard sample. We conducted X-ray absorption near-edge structure (XANES) analysis in fluorescence mode using the TES spectrometer. The excellent energy resolution of the TES enabled us to detect weak fluorescence lines from dilute samples and trace elements that have previously been difficult to resolve due to the nearly overlapping emission lines of other dominant elements. The neighboring lines of As K alpha and Pb L alpha2 of the standard sample were clearly resolved and the XANES of Pb L alpha2 was obtained. Moreover, the X-ray spectrum from the small amount of Fe in aerosols was distinguished from the spectrum of a blank target, which helps us to understand the targets and the environment. These results are the first important step for the application of high resolution TES-based spectroscopy at hard X-ray synchrotron facilities.

Source: arXiv:2604.21846v1 - http://arxiv.org/abs/2604.21846v1 PDF: https://arxiv.org/pdf/2604.21846v1 Original Link: http://arxiv.org/abs/2604.21846v1