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Research PaperResearchia:202606.01017

KLIP: localized distribution shift detection via KL-divergence with diffusion priors in Inverse Problems

Alireza Kheirandish

Abstract

Diffusion models have shown promising performance as data-driven priors for computational imaging, as well as some capacity to detect out-of-distribution (OOD) images. However, existing approaches to OOD detection often require some knowledge of the shifted distribution, fail to detect subtle or localized distribution shifts, and operate on full images, rather than the indirect measurements available in inverse problems. We propose an OOD detection metric based on the Kullback-Leibler divergence...

Submitted: June 1, 2026Subjects: Machine Learning; Data Science

Description / Details

Diffusion models have shown promising performance as data-driven priors for computational imaging, as well as some capacity to detect out-of-distribution (OOD) images. However, existing approaches to OOD detection often require some knowledge of the shifted distribution, fail to detect subtle or localized distribution shifts, and operate on full images, rather than the indirect measurements available in inverse problems. We propose an OOD detection metric based on the Kullback-Leibler divergence between the diffusion prior and the posterior distribution, that (i) does not require any calibration data or knowledge of the shifted distribution, and (ii) can detect whole images as OOD as well as localize OOD patches within an image. Experimentally, we show that this metric can detect subtle yet semantically meaningful distribution shifts, such as the shift from healthy liver CT scans to those with tumors, and generalizes across different types of diffusion models, datasets, and inverse problems. Our code can be found at https://github.com/voilalab/KLIP.


Source: arXiv:2605.31596v1 - http://arxiv.org/abs/2605.31596v1 PDF: https://arxiv.org/pdf/2605.31596v1 Original Link: http://arxiv.org/abs/2605.31596v1

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Submission Info
Date:
Jun 1, 2026
Topic:
Data Science
Area:
Machine Learning
Comments:
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