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Research PaperResearchia:202604.16036

Learning Low-Dimensional Representation for O-RAN Testing via Transformer-ESN

Jiongyu Dai

Abstract

Open Radio Access Network (O-RAN) architectures enhance flexibility for 6G and NextG networks. However, it also brings significant challenges in O-RAN testing with evaluating abundant, high-dimensional key performance indicators (KPIs). In this paper, we introduce a novel two-stage framework to learn temporally-aware low-dimensional representations of O-RAN testing KPIs. To be specific, stage one employs an information-theoretic H-score to train a hybrid self-attentive transformer and echo state...

Submitted: April 16, 2026Subjects: Engineering; Chemical Engineering

Description / Details

Open Radio Access Network (O-RAN) architectures enhance flexibility for 6G and NextG networks. However, it also brings significant challenges in O-RAN testing with evaluating abundant, high-dimensional key performance indicators (KPIs). In this paper, we introduce a novel two-stage framework to learn temporally-aware low-dimensional representations of O-RAN testing KPIs. To be specific, stage one employs an information-theoretic H-score to train a hybrid self-attentive transformer and echo state network (ESN) reservoir, called Transformer-ESN, capturing temporal dynamics and producing task-aligned 88-dimensional embeddings. Stage two evaluates these embeddings by training a lightweight multilayer perceptron (MLP) predictor exclusively on them for key target KPIs such as reference signal received quality (RSRQ) and spectral efficiency. Using real-world O-RAN testbed data (video streaming with interference), our approach demonstrates a significant advantage specifically when training samples are very limited. In this scenario, the low-dimensional representations learned from the Transformer-ESN yield mean square error (MSE) reductions of up to 41.9% for RSRQ and 29.9% for spectral efficiency compared to predictions from the original high-dimensional data. The framework exhibits high efficiency for O-RAN testing, significantly reducing testing complexities for O-RAN systems.


Source: arXiv:2604.12958v1 - http://arxiv.org/abs/2604.12958v1 PDF: https://arxiv.org/pdf/2604.12958v1 Original Link: http://arxiv.org/abs/2604.12958v1

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Date:
Apr 16, 2026
Topic:
Chemical Engineering
Area:
Engineering
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